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          EEPW首頁(yè) > 測(cè)試測(cè)量 > 設(shè)計(jì)應(yīng)用 > 優(yōu)化基于PXI平臺(tái)的無(wú)線測(cè)試

          優(yōu)化基于PXI平臺(tái)的無(wú)線測(cè)試

          作者: 時(shí)間:2017-06-04 來(lái)源:網(wǎng)絡(luò) 收藏

          本文引用地址:http://yuyingmama.com.cn/article/201706/347995.htm

          Larson Automation has developed an 802.11 board test station. This tester fully integrates the chip-set standard manufacturing test plan with engineering tools to control the test station and the Device Under Test (DUT) from a simple drill-down GUI interface. This system is used for production
          testing, engineering evaluation, or for manufacturing a debug station. In this article, Wayne explains how Larson Automation conducted testing on the PXI platform.

          在這篇文章里,作者介紹了Larson Automation 公司如何利用PXI平臺(tái)建立自動(dòng)化測(cè)試系統(tǒng)。全文請(qǐng)點(diǎn)擊:



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